John C. Stewart, John V. Monaco, Sung-Hyuk Cha, Charles C. Tappert. An investigation of keystroke and stylometry traits for authenticating online test takers. In Anil K. Jain, Arun Ross, Salil Prabhakar, Jaihie Kim, editors, 5th IAPR International Conference on Biometrics, ICB 2012, New Delhi, India, March 29 - April 1, 2012. pages 1-7, IEEE, 2011. [doi]
Abstract is missing.