Threshold voltage instabilities in p-channel power VDMOSFETs under pulsed NBT stress

Ninoslav Stojadinovic, D. Dankovic, I. Manic, A. Prijic, V. Davidovic, S. Djoric-Veljkovic, S. Golubovic, Z. Prijic. Threshold voltage instabilities in p-channel power VDMOSFETs under pulsed NBT stress. Microelectronics Reliability, 50(9-11):1278-1282, 2010. [doi]

Abstract

Abstract is missing.