Alessandro Strano, Crispín Gómez Requena, Daniele Ludovici, Michele Favalli, María Engracia Gómez, Davide Bertozzi. Exploiting Network-on-Chip structural redundancy for a cooperative and scalable built-in self-test architecture. In Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011. pages 661-666, IEEE, 2011. [doi]
@inproceedings{StranoGLFGB11,
title = {Exploiting Network-on-Chip structural redundancy for a cooperative and scalable built-in self-test architecture},
author = {Alessandro Strano and Crispín Gómez Requena and Daniele Ludovici and Michele Favalli and María Engracia Gómez and Davide Bertozzi},
year = {2011},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5763109},
researchr = {https://researchr.org/publication/StranoGLFGB11},
cites = {0},
citedby = {0},
pages = {661-666},
booktitle = {Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011},
publisher = {IEEE},
isbn = {978-1-61284-208-0},
}