Harnessing the base-pushout effect for ESD protection in bipolar and BiCMOS technologies

M. Streibl, K. Esmark, A. Sieck, Wolfgang Stadler, M. Wendel, J. Szatkowski, Harald Gossner. Harnessing the base-pushout effect for ESD protection in bipolar and BiCMOS technologies. Microelectronics Reliability, 43(7):1001-1010, 2003. [doi]

Abstract

Abstract is missing.