Charles E. Stroud, Keshia N. Leach, Thomas A. Slaughter. BIST for Xilinx 4000 and Spartan Series FPGAs: A Case Study. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 1258-1267, IEEE Computer Society, 2003. [doi]
Abstract is missing.