Cost Reduction in Mutation Testing with Bytecode-Level Mutants Classification

Joanna Strug, Barbara Strug. Cost Reduction in Mutation Testing with Bytecode-Level Mutants Classification. In Leszek Rutkowski, Rafal Scherer, Marcin Korytkowski, Witold Pedrycz, Ryszard Tadeusiewicz, Jacek M. Zurada, editors, Artificial Intelligence and Soft Computing - 17th International Conference, ICAISC 2018, Zakopane, Poland, June 3-7, 2018, Proceedings, Part I. Volume 10841 of Lecture Notes in Computer Science, pages 714-723, Springer, 2018. [doi]

Abstract

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