Analog signal metrology for mixed signal ICs

Chauchin Su, Yi-Ren Cheng, Yue-Tsang Chen, Shing Tenchen. Analog signal metrology for mixed signal ICs. In 6th Asian Test Symposium (ATS 97), 17-18 November 1997, Akita, Japan. pages 194, IEEE Computer Society, 1997. [doi]

Abstract

Abstract is missing.