Studying the Impact of Gate Tunneling on Dynamic Behaviors of Partially-Depleted SOI CMOS Using BSIMPD

Pin Su, Samel K. H. Fung, Weidong Liu, Chenming Hu. Studying the Impact of Gate Tunneling on Dynamic Behaviors of Partially-Depleted SOI CMOS Using BSIMPD. In ISQED. pages 487-491, 2002. [doi]

Abstract

Abstract is missing.