Stephen Y. H. Su, Tonysheng Lin. Functional testing techniques for digital LSI/VLSI systems. In Patricia H. Lambert, Hillel Ofek, Lawrence A. O'Neill, Pat O. Pistilli, Paul Losleben, J. D. Nash, Dennis W. Shaklee, Bryan T. Preas, Harvey N. Lerman, editors, Proceedings of the 21st Design Automation Conference, DAC '84, Albuquerque, New Mexico, June 25-27, 1984. pages 517-528, ACM/IEEE, 1984. [doi]
Abstract is missing.