Shyang-Tai Su, Rafic Z. Makki, Troy Nagle. Transient power supply current monitoring - A new test method for CMOS VLSI circuits. J. Electronic Testing, 6(1):23-43, 1995. [doi]
@article{SuMN95,
title = {Transient power supply current monitoring - A new test method for CMOS VLSI circuits},
author = {Shyang-Tai Su and Rafic Z. Makki and Troy Nagle},
year = {1995},
doi = {10.1007/BF00993128},
url = {http://dx.doi.org/10.1007/BF00993128},
tags = {testing},
researchr = {https://researchr.org/publication/SuMN95},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {6},
number = {1},
pages = {23-43},
}