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Shyang-Tai Su, Rafic Z. Makki, Troy Nagle. Transient power supply current monitoring - A new test method for CMOS VLSI circuits. J. Electronic Testing, 6(1):23-43, 1995. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Advancements in Power Supply Current TestingRafic Z. Makki. vlsi, 5(3), 1997. [doi] Transient Power Supply Current Testing of Digital CMOS CircuitsRafic Z. Makki, Shyang-Tai Su, Troy Nagle. itc 1995: 892-901
The following publications are possibly variants of this publication: