Masakatsu Suda, Kazuhiro Yamamoto, Toshiyuki Okayasu, Shusuke Kantake, Satoshi Sudou, Daisuke Watanabe. CMOS high-speed, high-precision timing generator for 4.266-Gbps memory test system. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 9, IEEE, 2005. [doi]
Abstract is missing.