Combining Bias and Variance Reduction Techniques for Regression Trees

Yuk Lai Suen, Prem Melville, Raymond J. Mooney. Combining Bias and Variance Reduction Techniques for Regression Trees. In João Gama, Rui Camacho, Pavel Brazdil, Alípio Jorge, Luís Torgo, editors, Machine Learning: ECML 2005, 16th European Conference on Machine Learning, Porto, Portugal, October 3-7, 2005, Proceedings. Volume 3720 of Lecture Notes in Computer Science, pages 741-749, Springer, 2005. [doi]

Abstract

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