High-Fidelity Device Tester Interface

Shigeru Sugamori, Kunio Takeuchi, Hiromi Maruyama, Shinpei Kamata. High-Fidelity Device Tester Interface. In Proceedings International Test Conference 1983, Philadelphia, PA, USA, October 1983. pages 371-378, IEEE Computer Society, 1983.

Authors

Shigeru Sugamori

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Kunio Takeuchi

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Hiromi Maruyama

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Shinpei Kamata

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