High-Fidelity Device Tester Interface

Shigeru Sugamori, Kunio Takeuchi, Hiromi Maruyama, Shinpei Kamata. High-Fidelity Device Tester Interface. In Proceedings International Test Conference 1983, Philadelphia, PA, USA, October 1983. pages 371-378, IEEE Computer Society, 1983.

@inproceedings{SugamoriTMK83,
  title = {High-Fidelity Device Tester Interface},
  author = {Shigeru Sugamori and Kunio Takeuchi and Hiromi Maruyama and Shinpei Kamata},
  year = {1983},
  researchr = {https://researchr.org/publication/SugamoriTMK83},
  cites = {0},
  citedby = {0},
  pages = {371-378},
  booktitle = {Proceedings International Test Conference 1983, Philadelphia, PA, USA, October 1983},
  publisher = {IEEE Computer Society},
}