Analysis and Definition of Overall Timing Accuracy in VLSI Test System

Shigeru Sugamori, Kenji Yoshida, Hiromi Maruyama, Shinpei Kamata, Tsuneta Sudo. Analysis and Definition of Overall Timing Accuracy in VLSI Test System. In Proceedings International Test Conference 1981, Philadelphia, PA, USA, October 1981. pages 143-153, IEEE Computer Society, 1981.

@inproceedings{SugamoriYMKS81,
  title = {Analysis and Definition of Overall Timing Accuracy in VLSI Test System},
  author = {Shigeru Sugamori and Kenji Yoshida and Hiromi Maruyama and Shinpei Kamata and Tsuneta Sudo},
  year = {1981},
  tags = {testing, analysis},
  researchr = {https://researchr.org/publication/SugamoriYMKS81},
  cites = {0},
  citedby = {0},
  pages = {143-153},
  booktitle = {Proceedings International Test Conference 1981, Philadelphia, PA, USA, October 1981},
  publisher = {IEEE Computer Society},
}