Analysis and Definition of Overall Timing Accuracy in VLSI Test System

Shigeru Sugamori, Kenji Yoshida, Hiromi Maruyama, Shinpei Kamata, Tsuneta Sudo. Analysis and Definition of Overall Timing Accuracy in VLSI Test System. In Proceedings International Test Conference 1981, Philadelphia, PA, USA, October 1981. pages 143-153, IEEE Computer Society, 1981.

No reviews for this publication, yet.