Speed and yield enhancement by track swapping on critical paths utilizing random variations for FPGAs

Yuuri Sugihara, Yohei Kume, Kazutoshi Kobayashi, Hidetoshi Onodera. Speed and yield enhancement by track swapping on critical paths utilizing random variations for FPGAs. In Mike Hutton, Paul Chow, editors, Proceedings of the ACM/SIGDA 16th International Symposium on Field Programmable Gate Arrays, FPGA 2008, Monterey, California, USA, February 24-26, 2008. pages 257, ACM, 2008. [doi]

Abstract

Abstract is missing.