Nik Sumikawa, Dragoljub Gagi Drmanac, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir. Understanding customer returns from a test perspective. In 29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA. pages 2-7, IEEE Computer Society, 2011. [doi]
Abstract is missing.