Fan-Keng Sun, Yao-Wen Chang. BiG: A Bivariate Gradient-Based Wirelength Model for Analytical Circuit Placement. In Proceedings of the 56th Annual Design Automation Conference 2019, DAC 2019, Las Vegas, NV, USA, June 02-06, 2019. pages 118, ACM, 2019. [doi]
Abstract is missing.