Haiying Sun, Mingsong Chen, Min Zhang, Jing Liu, Ying Zhang. Improving Defect Detection Ability of Derived Test Cases Based on Mutated UML Activity Diagrams. In 40th IEEE Annual Computer Software and Applications Conference, COMPSAC 2016, Atlanta, GA, USA, June 10-14, 2016. pages 275-280, IEEE, 2016. [doi]
Abstract is missing.