Chang-ai Sun, Cuiyang Fan, Zhen Wang, Huai Liu. d(mu)Reg: A Path-Aware Mutation Analysis Guided Approach to Regression Testing. In 12th IEEE/ACM International Workshop on Automation of Software Testing, AST@ICSE 2017, Buenos Aires, Argentina, May 20-21, 2017. pages 59-64, IEEE Computer Society, 2017. [doi]
Abstract is missing.