A novel method for measuring thick film thermal conductivity

Wei-Che Sun, Mei-Jiau Huang, Heng-Chieh Chien, Tien-Yao Chang, Da-Jeng Yao. A novel method for measuring thick film thermal conductivity. In 5th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2010, Xiamen, China, January 20-23, 2010. pages 1052-1056, IEEE, 2010. [doi]

Abstract

Abstract is missing.