Repurposing FPGAs for Tester Design to Enhance Field-Testing in a 3D Stack

Yi Sun, Fanchen Zhang, Hui Jiang, Kundan Nepal, Jennifer Dworak, Theodore W. Manikas, R. Iris Bahar. Repurposing FPGAs for Tester Design to Enhance Field-Testing in a 3D Stack. J. Electronic Testing, 35(6):887-900, 2019. [doi]

Abstract

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