Stephen K. Sunter, Aubin Roy. Adaptive parametric BIST of high-speed parallel I/Os via standard boundary scan. In Bill Eklow, R. D. (Shawn) Blanton, editors, 2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, September 20-22, 2011. pages 1-9, IEEE, 2011. [doi]
Abstract is missing.