Bambang Suparjo, Adam W. Ley, Adam Cron, Heiko Ehrenberg. Analog Boundary-Scan Description Language (ABSDL) for Mixed-Signal Board Test. In Scott Davidson, Anne Gattiker, editors, 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. pages 1-9, IEEE, 2006. [doi]
Abstract is missing.