Vikram B. Suresh, Wayne P. Burleson. Robust metastability-based TRNG design in nanometer CMOS with sub-vdd pre-charge and hybrid self-calibration. In Keith A. Bowman, Kamesh V. Gadepally, Pallab Chatterjee, Mark M. Budnik, Lalitha Immaneni, editors, Thirteenth International Symposium on Quality Electronic Design, ISQED 2012, Santa Clara, CA, USA, March 19-21, 2012. pages 298-305, IEEE, 2012. [doi]
Abstract is missing.