Vikram B. Suresh, Sandip Kundu. Managing test coverage uncertainty due to thermal noise in nano-CMOS: A case-study on an SRAM array. In 2013 IEEE 31st International Conference on Computer Design, ICCD 2013, Asheville, NC, USA, October 6-9, 2013. pages 201-206, IEEE, 2013. [doi]
Abstract is missing.