28 Challenge-Response Machine-Learning Resistant Strong-PUF in 14nm CMOS Featuring Stability-Aware Adversarial Challenge Selection

Vikram B. Suresh, Raghavan Kumar, Mark Anders, Himanshu Kaul, Vivek De, Sanu Mathew. 28 Challenge-Response Machine-Learning Resistant Strong-PUF in 14nm CMOS Featuring Stability-Aware Adversarial Challenge Selection. In IEEE Symposium on VLSI Circuits, VLSI Circuits 2020, Honolulu, HI, USA, June 16-19, 2020. pages 1-2, IEEE, 2020. [doi]

Abstract

Abstract is missing.