Masamichi Suzuki, Atsuhiro Kinoshita, Yuichiro Mitani. Improvement of gate disturb degradation in SONOS FETs for Vth mismatch compensation in CMOS analog circuits. In Proceedings of 2013 International Conference on IC Design & Technology, ICICDT 2013, Pavia, Italy, May 29-31, 2013. pages 195-198, IEEE, 2013. [doi]
Abstract is missing.