Hiroaki Suzuki, Masanori Kurimoto, Tadao Yamanaka, Hidehiro Takata, Hiroshi Makino, Hirofumi Shinohara. Post-silicon programmed body-biasing platform suppressing device variability in 45 nm CMOS technology. In Vijaykrishnan Narayanan, C. P. Ravikumar, Jörg Henkel, Ali Keshavarzi, Vojin G. Oklobdzija, Barry M. Pangrle, editors, Proceedings of the 2008 International Symposium on Low Power Electronics and Design, 2008, Bangalore, India, August 11-13, 2008. pages 15-20, ACM, 2008. [doi]
Abstract is missing.