Junichi Suzuki, Junichi Yamashita, Masami Hanyu, Masamichi Ido, Tatsuya Saito, Yasuhiro Nakashima, Masanori Hayashikoshi, Yukiyoshi Kiyota. A Cost-Effective High Accuracy Auto-Trimming System without Tester Constraint for Low-End Embedded Flash Memory. In International SoC Design Conference, ISOCC 2018, Daegu, South Korea, November 12-15, 2018. pages 48-49, IEEE, 2018. [doi]
Abstract is missing.