Brian Swahn, Soha Hassoun. METS: A Metric for Electro-Thermal Sensitivity, and Its Application To FinFETs. In 7th International Symposium on Quality of Electronic Design (ISQED 2006), 27-29 March 2006, San Jose, CA, USA. pages 121-126, IEEE Computer Society, 2006. [doi]
Abstract is missing.