Infall Syafalni, Tsutomu Sasao, Xiaoqing Wen, Stefan Holst, Kohei Miyase. A soft-error tolerant TCAM using partial don't-care keys. In 20th IEEE European Test Symposium, ETS 2015, Cluj-Napoca, Romania, 25-29 May, 2015. pages 1-2, IEEE, 2015. [doi]
Abstract is missing.