Identifying Untestable Transition Faults in Latch Based Designs with Multiple Clocks

Manan Syal, Michael S. Hsiao, Sreejit Chakravarty. Identifying Untestable Transition Faults in Latch Based Designs with Multiple Clocks. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 1034-1043, IEEE, 2004. [doi]

Abstract

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