Identifying Untestable Transition Faults in Latch Based Designs with Multiple Clocks - researchr publication bibliographies

researchr

You are not signed in
Sign in
Sign up

Manan Syal, Michael S. Hsiao, Sreejit Chakravarty. Identifying Untestable Transition Faults in Latch Based Designs with Multiple Clocks. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 1034-1043, IEEE, 2004. [doi]

runs on WebDSL