Manan Syal, Michael S. Hsiao, Sreejit Chakravarty. Identifying Untestable Transition Faults in Latch Based Designs with Multiple Clocks. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 1034-1043, IEEE, 2004. [doi]
@inproceedings{SyalHC04, title = {Identifying Untestable Transition Faults in Latch Based Designs with Multiple Clocks}, author = {Manan Syal and Michael S. Hsiao and Sreejit Chakravarty}, year = {2004}, doi = {10.1109/ITC.2004.89}, url = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.89}, tags = {rule-based}, researchr = {https://researchr.org/publication/SyalHC04}, cites = {0}, citedby = {0}, pages = {1034-1043}, booktitle = {Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA}, publisher = {IEEE}, isbn = {0-7803-8581-0}, }