Enhancing the Static Noise Margins by Upsizing Length for Ultra-Low Voltage/Power/Energy Gates

Mihai Tache, Valeriu Beiu, Walid Ibrahim, Fekri Kharbash, Massimo Alioto. Enhancing the Static Noise Margins by Upsizing Length for Ultra-Low Voltage/Power/Energy Gates. J. Low Power Electronics, 10(1):137-148, 2014. [doi]

Abstract

Abstract is missing.