Automatic Configuration Generation for FPGA Interconnect Testing - researchr publication

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Mehdi Baradaran Tahoori, Subhasish Mitra. Automatic Configuration Generation for FPGA Interconnect Testing. In 21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA. pages 134-144, IEEE Computer Society, 2003. [doi]

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