Morphed Standard Cell Layouts for Pin Length Reduction

Cheng-Wei Tai, Rung-Bin Lin. Morphed Standard Cell Layouts for Pin Length Reduction. In 2019 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2019, Miami, FL, USA, July 15-17, 2019. pages 94-99, IEEE, 2019. [doi]

Abstract

Abstract is missing.