Katsuyuki Takabatake, Toshimitsu Masuzawa, Michiko Inoue, Hideo Fujiwara. Non-scan design for testable data paths using thru operation. In Proceedings of the ASP-DAC '97 Asia and South Pacific Design Automation Conference, Nippon Convention Center, Chiba, Japan, January 28-31, 1997. pages 313-318, IEEE, 1997. [doi]
Abstract is missing.