Hiroshi Takahashi, Yukihiro Yamamoto, Yoshinobu Higami, Yuzo Takamatsu. Enhancing BIST Based Single/Multiple Stuck-at Fault Diagnosis by Ambiguous Test Set. In 13th Asian Test Symposium (ATS 2004), 15-17 November 2004, Kenting, Taiwan. pages 216-221, IEEE Computer Society, 2004. [doi]
Abstract is missing.