Programs for verifying circuit connectivity of mos/lsi mask artwork

Makoto Takashima, Takashi Mitsuhashi, Toshiaki Chiba, Kenji Yoshida. Programs for verifying circuit connectivity of mos/lsi mask artwork. In James S. Crabbe, Charles E. Radke, Hillel Ofek, editors, Proceedings of the 19th Design Automation Conference, DAC '82, Las Vegas, Nevada, USA, June 14-16, 1982. pages 544-550, ACM/IEEE, 1982. [doi]

Authors

Makoto Takashima

This author has not been identified. Look up 'Makoto Takashima' in Google

Takashi Mitsuhashi

This author has not been identified. Look up 'Takashi Mitsuhashi' in Google

Toshiaki Chiba

This author has not been identified. Look up 'Toshiaki Chiba' in Google

Kenji Yoshida

This author has not been identified. Look up 'Kenji Yoshida' in Google