Makoto Takashima, Takashi Mitsuhashi, Toshiaki Chiba, Kenji Yoshida. Programs for verifying circuit connectivity of mos/lsi mask artwork. In James S. Crabbe, Charles E. Radke, Hillel Ofek, editors, Proceedings of the 19th Design Automation Conference, DAC '82, Las Vegas, Nevada, USA, June 14-16, 1982. pages 544-550, ACM/IEEE, 1982. [doi]