Programs for verifying circuit connectivity of mos/lsi mask artwork

Makoto Takashima, Takashi Mitsuhashi, Toshiaki Chiba, Kenji Yoshida. Programs for verifying circuit connectivity of mos/lsi mask artwork. In James S. Crabbe, Charles E. Radke, Hillel Ofek, editors, Proceedings of the 19th Design Automation Conference, DAC '82, Las Vegas, Nevada, USA, June 14-16, 1982. pages 544-550, ACM/IEEE, 1982. [doi]

@inproceedings{TakashimaMCY82,
  title = {Programs for verifying circuit connectivity of mos/lsi mask artwork},
  author = {Makoto Takashima and Takashi Mitsuhashi and Toshiaki Chiba and Kenji Yoshida},
  year = {1982},
  doi = {10.1145/800263.809257},
  url = {http://doi.acm.org/10.1145/800263.809257},
  researchr = {https://researchr.org/publication/TakashimaMCY82},
  cites = {0},
  citedby = {0},
  pages = {544-550},
  booktitle = {Proceedings of the 19th Design Automation Conference, DAC '82, Las Vegas, Nevada, USA, June 14-16, 1982},
  editor = {James S. Crabbe and Charles E. Radke and Hillel Ofek},
  publisher = {ACM/IEEE},
  isbn = {0-89791-020-6},
}