Analysis of interior degradation of a laser waveguide using an OBIC monitor

Tatsuya Takeshita, Ryuzo Iga, Mitsuo Yamamoto, Mitsuru Sugo. Analysis of interior degradation of a laser waveguide using an OBIC monitor. Microelectronics Reliability, 47(12):2135-2140, 2007. [doi]

Abstract

Abstract is missing.