Wing Chiu Tam, Osei Poku, R. D. (Shawn) Blanton. Precise failure localization using automated layout analysis of diagnosis candidates. In Limor Fix, editor, Proceedings of the 45th Design Automation Conference, DAC 2008, Anaheim, CA, USA, June 8-13, 2008. pages 367-372, ACM, 2008. [doi]
Abstract is missing.