A robust DC current generation and measurement technique for deep submicron circuits

C. K. L. Tam, Gordon W. Roberts. A robust DC current generation and measurement technique for deep submicron circuits. In International Symposium on Circuits and Systems (ISCAS 2001), 6-9 May 2001, Sydney, Australia. pages 719-722, IEEE, 2001. [doi]

Abstract

Abstract is missing.