C. K. L. Tam, Gordon W. Roberts. A robust DC current generation and measurement technique for deep submicron circuits. In International Symposium on Circuits and Systems (ISCAS 2001), 6-9 May 2001, Sydney, Australia. pages 719-722, IEEE, 2001. [doi]
@inproceedings{TamR01,
title = {A robust DC current generation and measurement technique for deep submicron circuits},
author = {C. K. L. Tam and Gordon W. Roberts},
year = {2001},
doi = {10.1109/ISCAS.2001.921957},
url = {http://doi.ieeecomputersociety.org/10.1109/ISCAS.2001.921957},
tags = {C++},
researchr = {https://researchr.org/publication/TamR01},
cites = {0},
citedby = {0},
pages = {719-722},
booktitle = {International Symposium on Circuits and Systems (ISCAS 2001), 6-9 May 2001, Sydney, Australia},
publisher = {IEEE},
isbn = {0-7803-6685-9},
}