Recent advances in EM and BTI induced reliability modeling, analysis and optimization (invited)

Sheldon X.-D. Tan, Hussam Amrouch, Taeyoung Kim, Zeyu Sun, Chase Cook, Jörg Henkel. Recent advances in EM and BTI induced reliability modeling, analysis and optimization (invited). Integration, 60:132-152, 2018. [doi]

Abstract

Abstract is missing.